By Francis C. Wang
Fresh technological advances have created a checking out trouble within the electronics industry--smaller, extra hugely built-in digital circuits and new packaging suggestions make it more and more tough to bodily entry attempt nodes. New trying out tools are wanted for the following iteration of digital apparatus and loads of emphasis is being put on the improvement of those equipment. a number of the thoughts now changing into well known contain layout for testability (DFT), integrated self-test (BIST), and automated try out vector new release (ATVG). This publication will offer a realistic advent to those and different checking out suggestions. for every procedure brought, the writer offers real-world examples so the reader can in attaining a operating wisdom of ways to settle on and follow those more and more very important checking out tools.
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Additional info for Digital Circuit Testing. A Guide to DFT and Other Techniques
9, we define the following terminologies. Fanout Stem: The lead in a fanout node where the signal originates. 9. For instance, the stem can be the output of an AND gate that drives other gates connected to it. Fanout Branch: One of many leads connected to the stem. A branch must carry the signal with the same logic values as the stem. Reconvergent Node: A gate with several inputs and some of the signals carried are originated from the same stem. As we see in equations (24) and (25), the logic values on the branches and the stem are the same and also the logic value count equals the maximum logic value count among the stem and the branches.
16, the input lead marked with a circle denotes a "driving" lead and all other leads are the "driven" leads. For instance, if the driving lead of an AND gate is required to have a 0 + , all other driven input leads must be set to 1 " and the driven output lead must have a 0+. 18 illustrate backward sensitivity and backward insensitivity drive. Note that there is no forward insensitivity drive. 15, if the type of gate is an XOR gate, either output of the last XOR gate in the path (assuming more than one), or the single XOR gate if only one exists, is made the new driving lead.
1. Also note that in this method of test generation there is no need to run a fault simulator to determine fault coverage for the test vectors generated. For traditional testability measure algorithms, the actual testing requirements have seldom been considered in deriving the testability information of a circuit. 1 Test generation directly from testability measure results. 22 Background in Test Counting 39 outputs for various types of gates. With this approach, the faults to be detected can be prespecified as input parameters to the testability analyzer.