By Sadao Adachi, Peter Capper, Safa Kasap, Arthur Willoughby
The most goal of this ebook is to supply a accomplished remedy of the fabrics points of group-IV, III−V and II−VI semiconductor alloys utilized in a number of digital and optoelectronic units. the themes coated during this booklet comprise the structural, thermal, mechanical, lattice vibronic, digital, optical and service shipping houses of such semiconductor alloys. The e-book reports not just usually identified alloys (SiGe, AlGaAs, GaInPAs, and ZnCdTe) but additionally new alloys, similar to dilute-carbon alloys (CSiGe, CSiSn, etc.), III−N alloys, dilute-nitride alloys (GaNAs and GaInNAs) and Mg- or Be-based II−VI semiconductor alloys. eventually there's an in depth bibliography integrated in case you desire to locate more information in addition to tabulated values and graphical info at the homes of semiconductor alloys.
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Additional resources for Properties of Semiconductor Alloys: Group-IV, III-V and II-VI Semiconductors (Wiley Series in Materials for Electronic & Optoelectronic Applications)
Bearch, H. Al Thani, S. McCray, R. T. Collins, and J. A. Turner, J. Appl. Phys. 91, 5190 (2002).  L. T. Romano, B. S. Krusor, M. D. McCluskey, and D. P. Bour, Appl. Phys. Lett. 73, 1757 (1998).  M. E. Aumer, S. F. LeBoeuf, F. G. McIntosh, and S. M. Bedair, Appl. Phys. Lett. 75, 3315 (1999).  G. Bisognin, D. D. Salvador, C. Mattevi, M. Berti, A. V. Drigo, G. Ciatto, L. Grenouillet, P. Duvaut, G. Gilet, and H. Mariette, J. Appl. Phys. 95, 48 (2004).  S. Z. Wang, S. F. Yoon, W. J. Fan, W.
This model is in excellent agreement with the experimental data. The critical thicknesses hc for AlxGa1 xN and GaxIn1 xN on relaxed GaN layers were measured by Akasaki and Amano . 95). 30. 5 for II VI semiconductors. It should be noted that the II VI semiconductors have weak bond strength. The dislocation energy in such semiconductors is much smaller than those in SixGe1 x/Si and III V semiconductors. Therefore, dislocations can be more easily generated in the II VI semiconductors. 30 Critical thickness hc for (a) SixGe1Àx, (b) III V and (c) II VI semiconductors grown on various lattice mismatched substrates.
E. Nahory, M. A. Pollack, W. D. , and R. L. Barns, Appl. Phys. Lett. 33, 659 (1978).  F. Germini, C. Bocchi, C. Ferrari, S. Franchi, A. Baraldi, R. Magnanini, D. D. Salvador, M. Berti, and A. V. Drigo, J. Phys. D: Appl. Phys. 32, A12 (1999).  J. D. Bearch, H. Al Thani, S. McCray, R. T. Collins, and J. A. Turner, J. Appl. Phys. 91, 5190 (2002).  L. T. Romano, B. S. Krusor, M. D. McCluskey, and D. P. Bour, Appl. Phys. Lett. 73, 1757 (1998).  M. E. Aumer, S. F. LeBoeuf, F. G. McIntosh, and S.